Dependence of the MHD shock thickness on the finite electrical conductivity (2003)
- Authors:
- USP affiliated author: OPHER, REUVEN - IAG
- School: IAG
- Subject: MEIO INTERESTELAR
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Física
- Place of publication: São Paulo
- Date published: 2003
- Source:
- Título do periódico: Program and Abstracts
- Conference title: Latin American Workshop on Plasma Physics
-
ABNT
KANDUS, Alejandra; OPHER, Reuven. Dependence of the MHD shock thickness on the finite electrical conductivity. Anais.. São Paulo: Sociedade Brasileira de Física, 2003. -
APA
Kandus, A., & Opher, R. (2003). Dependence of the MHD shock thickness on the finite electrical conductivity. In Program and Abstracts. São Paulo: Sociedade Brasileira de Física. -
NLM
Kandus A, Opher R. Dependence of the MHD shock thickness on the finite electrical conductivity. Program and Abstracts. 2003 ; -
Vancouver
Kandus A, Opher R. Dependence of the MHD shock thickness on the finite electrical conductivity. Program and Abstracts. 2003 ; - Producing superhearvy dark matter during inflation
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