Young modulus measurement of nanostructured metallic thin films (2004)
- Authors:
- USP affiliated authors: SALVADORI, MARIA CECILIA BARBOSA DA SILVEIRA - IF ; CATTANI, MAURO SERGIO DORSA - IF
- Unidade: IF
- Subjects: MATERIAIS; FILMES FINOS; NANOTECNOLOGIA
- Language: Inglês
- Imprenta:
- Publisher place: Switzerland
- Date published: 2004
- Source:
- Título do periódico: Journal of Metastable and Nanocrystalline Materials
- ISSN: 1422-6375
-
ABNT
VAZ, A R e SALVADORI, Maria Cecília Barbosa da Silveira e CATTANI, Mauro Sérgio Dorsa. Young modulus measurement of nanostructured metallic thin films. Journal of Metastable and Nanocrystalline Materials, 2004Tradução . . Disponível em: http://publica-sbi.if.usp.br/PDFs/pd001.pdf. Acesso em: 11 ago. 2024. -
APA
Vaz, A. R., Salvadori, M. C. B. da S., & Cattani, M. S. D. (2004). Young modulus measurement of nanostructured metallic thin films. Journal of Metastable and Nanocrystalline Materials. Recuperado de http://publica-sbi.if.usp.br/PDFs/pd001.pdf -
NLM
Vaz AR, Salvadori MCB da S, Cattani MSD. Young modulus measurement of nanostructured metallic thin films [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 ago. 11 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd001.pdf -
Vancouver
Vaz AR, Salvadori MCB da S, Cattani MSD. Young modulus measurement of nanostructured metallic thin films [Internet]. Journal of Metastable and Nanocrystalline Materials. 2004 ;[citado 2024 ago. 11 ] Available from: http://publica-sbi.if.usp.br/PDFs/pd001.pdf - Critical exponent measurement of poor quality diamond films
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