Structural and electrical properties of PZT thin films after annealing under oxygen pressure (2003)
- Authors:
- USP affiliated author: JARDIM, RENATO DE FIGUEIREDO - IF
- School: IF
- Subject: FILMES FINOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumos
- Conference title: Encontro Nacional de Física da Matéria Condensada 26
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ABNT
ESCOTE, M T et al. Structural and electrical properties of PZT thin films after annealing under oxygen pressure. 2003, Anais.. São Paulo: SBF, 2003. . Acesso em: 28 jun. 2022. -
APA
Escote, M. T., Pontes, F. M., Leite, E. R., Longo, E., & Jardim, R. F. (2003). Structural and electrical properties of PZT thin films after annealing under oxygen pressure. In Resumos. São Paulo: SBF. -
NLM
Escote MT, Pontes FM, Leite ER, Longo E, Jardim RF. Structural and electrical properties of PZT thin films after annealing under oxygen pressure. Resumos. 2003 ;[citado 2022 jun. 28 ] -
Vancouver
Escote MT, Pontes FM, Leite ER, Longo E, Jardim RF. Structural and electrical properties of PZT thin films after annealing under oxygen pressure. Resumos. 2003 ;[citado 2022 jun. 28 ] - Two-dimensional magnetic correlations and partial long-range order in geometrically frustrated 'SR IND. 2''Y''RU''O IND. 6'
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