Microstructure, magnetic and electrical properties of Co films on Si: thermal, thickness and roughness dependence (2002)
- Authors:
- Autor USP: MISSELL, FRANK PATRICK - IF
- Unidade: IF
- Subjects: MAGNETISMO; MATERIAIS MAGNÉTICOS; MAGNETISMO; MATERIAIS (PROPRIEDADES ELÉTRICAS)
- Language: Inglês
- Imprenta:
- Source:
- Título: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
CARVALHO, Hugo Bontette et al. Microstructure, magnetic and electrical properties of Co films on Si: thermal, thickness and roughness dependence. 2002, Anais.. São Paulo: SBF, 2002. . Acesso em: 17 abr. 2026. -
APA
Carvalho, H. B., Brasil, M. J. S. P., Knobel, M., Denardin, J. C., & Missell, F. P. (2002). Microstructure, magnetic and electrical properties of Co films on Si: thermal, thickness and roughness dependence. In Resumos. São Paulo: SBF. -
NLM
Carvalho HB, Brasil MJSP, Knobel M, Denardin JC, Missell FP. Microstructure, magnetic and electrical properties of Co films on Si: thermal, thickness and roughness dependence. Resumos. 2002 ;[citado 2026 abr. 17 ] -
Vancouver
Carvalho HB, Brasil MJSP, Knobel M, Denardin JC, Missell FP. Microstructure, magnetic and electrical properties of Co films on Si: thermal, thickness and roughness dependence. Resumos. 2002 ;[citado 2026 abr. 17 ] - Microstructure of hybrid magnets by SEM and AFM
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