On testing statistics for comparing several measuring devices (2002)
- Authors:
- Autor USP: BOLFARINE, HELENO - IME
- Unidade: IME
- Assunto: ESTIMAÇÃO PARAMÉTRICA
- Language: Inglês
- Imprenta:
- Publisher: IMECC-UNICAMP
- Publisher place: Campinas
- Date published: 2002
-
ABNT
VILCA LABRA, Filidor Edilfonso e LACHOS DÁVILA, Victor Hugo e BOLFARINE, Heleno. On testing statistics for comparing several measuring devices. . Campinas: IMECC-UNICAMP. . Acesso em: 18 set. 2024. , 2002 -
APA
Vilca Labra, F. E., Lachos Dávila, V. H., & Bolfarine, H. (2002). On testing statistics for comparing several measuring devices. Campinas: IMECC-UNICAMP. -
NLM
Vilca Labra FE, Lachos Dávila VH, Bolfarine H. On testing statistics for comparing several measuring devices. 2002 ;[citado 2024 set. 18 ] -
Vancouver
Vilca Labra FE, Lachos Dávila VH, Bolfarine H. On testing statistics for comparing several measuring devices. 2002 ;[citado 2024 set. 18 ] - Some shrinkage techniques for predicting the population total in finite populations
- Contribuições a teoria da previsão bayesiana e métodos relacionados em populações finitas
- Prediction in a finite population under a generalized linear model
- Inference under representable priors for Pearson type II models in finite populations
- Measurement error models with nonconstant covariance matrices
- Inference and local influence assessment in skew-normal null intercept measurement error model
- Large-sample inference for the Epsilon-Skew-t distribution
- Properties and Inference on the Skew-Curved-Symmetric Family of Distributions
- Multivariate measurement error models based on scale mixtures of the skew-normal distribution
- Bayesian estimation of regression parameters in elliptical measurement error models
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