Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry

Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry (2001)

Authors:
USP affiliated authors: MURAMATSU, MIKIYA - IF ; PAIVA, JOÃO BATISTA DE - FO ; RINO NETO, JOSÉ - FO
Unidades: IF; FO
Subjects: FÍSICA ÓPTICA; HOLOGRAFIA; ODONTOLOGIA
Language: Inglês
Imprenta:
- Publisher: SPIE
- Publisher place: Bellingham, Wash.
- Date published: 2001
Source:
- Volume/Número/Paginação/Ano: v. 4419, p. 247-251, 2001
Conference titles: Iberoamerican Meeting on Optics

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ABNT

BATISTA, Luis R; MURAMATSU, Mikiya; MARUYANA, Natalia Eiko; PAIVA, João Batista de; RINO NETO, Jose. Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry. [S.l: s.n.], 2001.
APA

Batista, L. R., Muramatsu, M., Maruyana, N. E., Paiva, J. B. de, & Rino Neto, J. (2001). Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry. Bellingham, Wash.: SPIE.
NLM

Batista LR, Muramatsu M, Maruyana NE, Paiva JB de, Rino Neto J. Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry. 2001 ; 4419 247-251.
Vancouver

Batista LR, Muramatsu M, Maruyana NE, Paiva JB de, Rino Neto J. Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry. 2001 ; 4419 247-251.