Evaluating the reproducibility of diamond replicas on silicon substrate by AFM (2000)
- Authors:
- USP affiliated authors: SALVADORI, MARIA CECILIA BARBOSA DA S - IF ; CATTANI, MAURO SERGIO DORSA - IF
- Unidade: IF
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
-
ABNT
PASSARO, Angela Maria Pizzo et al. Evaluating the reproducibility of diamond replicas on silicon substrate by AFM. 2000, Anais.. São Paulo: SBF, 2000. . Acesso em: 30 set. 2024. -
APA
Passaro, A. M. P., Salvadori, M. C. B. da S., Martins, D. R., & Cattani, M. S. D. (2000). Evaluating the reproducibility of diamond replicas on silicon substrate by AFM. In Resumos. São Paulo: SBF. -
NLM
Passaro AMP, Salvadori MCB da S, Martins DR, Cattani MSD. Evaluating the reproducibility of diamond replicas on silicon substrate by AFM. Resumos. 2000 ;[citado 2024 set. 30 ] -
Vancouver
Passaro AMP, Salvadori MCB da S, Martins DR, Cattani MSD. Evaluating the reproducibility of diamond replicas on silicon substrate by AFM. Resumos. 2000 ;[citado 2024 set. 30 ] - Critical exponent measurement of poor quality diamond films
- Dynamic scaling phenomena in diamond film growth
- Critical exponents of diamond films: possible influence of spatially correlated noise
- Metal ion mixing in diamond
- Estudo e fabricação de microbocais sônicos de diamante
- Nanostructured metallic thin films: measurement of critical exponents
- Young modulus measurements of nanostructured palladium thin films
- Nanostructured gold thin films: young modulus measurement
- Young modulus measurement of nanostructured metallic thin films
- Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films
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