Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon

Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon (1990)

Authors:
Autor USP: AEGERTER, MICHEL ANDRE - IFSC
Unidade: IFSC
DOI: 10.1016/0022-3093(90)90213-6
Assunto: FÍSICA
Language: Inglês
Source:
- Título do periódico: Journal of Non-Crystalline Solids
- Volume/Número/Paginação/Ano: v.120, n.1-3, p.275-82, 1990

Informações sobre o DOI: 10.1016/0022-3093(90)90213-6 (Fonte: oaDOI API)

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ABNT

TADA, M; OHSAKI, H; AEGERTER, M A. Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon. Journal of Non-Crystalline Solids[S.l.], v. 120, n. 1-3, p. 275-82, 1990. DOI: 10.1016/0022-3093(90)90213-6.
APA

Tada, M., Ohsaki, H., & Aegerter, M. A. (1990). Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon. Journal of Non-Crystalline Solids, 120( 1-3), 275-82. doi:10.1016/0022-3093(90)90213-6
NLM

Tada M, Ohsaki H, Aegerter MA. Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon. Journal of Non-Crystalline Solids. 1990 ;120( 1-3): 275-82.
Vancouver

Tada M, Ohsaki H, Aegerter MA. Structural difference of surface and sub-surface native oxides of evaporated amorphous silicon. Journal of Non-Crystalline Solids. 1990 ;120( 1-3): 275-82.