High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate (2013)
- Autores:
- Autores USP: SILVA, MARCELO DE ASSUMPCAO PEREIRA DA - IFSC ; NUNES, LUIZ ANTONIO DE OLIVEIRA - IFSC ; LI, MAXIMO SIU - IFSC ; MAREGA JUNIOR, EUCLYDES - IFSC
- Unidade: IFSC
- Assuntos: FILMES FINOS; ESPECTROSCOPIA; TERRAS RARAS
- Idioma: Inglês
- Imprenta:
- Editora: International Society for Optical Engineering - SPIE
- Local: Bellingham
- Data de publicação: 2013
- Fonte:
- Título do periódico: Technical Summaries
- Nome do evento: Photonics West
-
ABNT
RIVERA, Victor A. et al. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. 2013, Anais.. Bellingham: International Society for Optical Engineering - SPIE, 2013. . Acesso em: 23 abr. 2024. -
APA
Rivera, V. A., Ferri, F. A., Huaman, J. C., Kawamura, M., Silva, M. de A. P. da, Nunes, L. A. de O., et al. (2013). High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. In Technical Summaries. Bellingham: International Society for Optical Engineering - SPIE. -
NLM
Rivera VA, Ferri FA, Huaman JC, Kawamura M, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. Technical Summaries. 2013 ;[citado 2024 abr. 23 ] -
Vancouver
Rivera VA, Ferri FA, Huaman JC, Kawamura M, Silva M de AP da, Nunes LA de O, Siu Li M, Marega Júnior E. High near-infrared emission intensity of Er3+- doped zirconium oxide films on a Si (100) substrate. Technical Summaries. 2013 ;[citado 2024 abr. 23 ] - High near-infrared emission intensity of Er3+-doped zirconium oxide films on a Si(100) substrate
- High red emission intensity of Eu:Y2O3 films grown on Si(1 0 0)/Si (1 1 1) by electron beam evaporation
- High emission intensity of 'Er POT. 3+'- doped zirconium films on a Si(100) substrate
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- Near-infrared light emission of Er3+-doped zirconium oxide thin films: an optical, structural and XPS study
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- Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy
- Hight-resolution photoelectron spectroscopy studies on W'O IND.3' films modified by Ag addition
- Propriedades otica e estrutural de filmes de k'BR': 'CU POT.+'
- Correlacao entre as propriedades oticas e a microestrutura de filmes de k'BR': 'CU POT.+' Em diferentes temperaturas do substrato
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