Measurement of two particle resolution in silicon drift detectors (1998)
- Authors:
- Autor USP: TAKAHASHI, JIRO - IF
- Unidade: IF
- DOI: 10.1109/23.682400
- Assunto: DETETORES
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: IEEE Transactions on Nuclear Science
- ISSN: 0018-9499
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
PANDEY, S U et al. Measurement of two particle resolution in silicon drift detectors. IEEE Transactions on Nuclear Science, 1998Tradução . . Disponível em: https://doi.org/10.1109/23.682400. Acesso em: 19 abr. 2024. -
APA
Pandey, S. U., Bellwied, R., Bettenmueller, R., Caines, H., Chen, W., DiMassino, D., et al. (1998). Measurement of two particle resolution in silicon drift detectors. IEEE Transactions on Nuclear Science. doi:10.1109/23.682400 -
NLM
Pandey SU, Bellwied R, Bettenmueller R, Caines H, Chen W, DiMassino D, Dyke H, Hall J, Takahashi J. Measurement of two particle resolution in silicon drift detectors [Internet]. IEEE Transactions on Nuclear Science. 1998 ;[citado 2024 abr. 19 ] Available from: https://doi.org/10.1109/23.682400 -
Vancouver
Pandey SU, Bellwied R, Bettenmueller R, Caines H, Chen W, DiMassino D, Dyke H, Hall J, Takahashi J. Measurement of two particle resolution in silicon drift detectors [Internet]. IEEE Transactions on Nuclear Science. 1998 ;[citado 2024 abr. 19 ] Available from: https://doi.org/10.1109/23.682400 - Corrigendum to‘‘Experimental investigations on the first Townsend coefficient inpure isobutane’’[Nucl.Instr.and Meth.A670(2012)55–60]
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Informações sobre o DOI: 10.1109/23.682400 (Fonte: oaDOI API)
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