Measurement of critical exponents of nanostructured gold thin films (2003)
- Authors:
- USP affiliated authors: SALVADORI, MARIA CECILIA BARBOSA DA SILVEIRA - IF ; CATTANI, MAURO SERGIO DORSA - IF
- Unidade: IF
- Subjects: FILMES FINOS; MICROSCOPIA ELETRÔNICA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Surface Review and Letters
-
ABNT
MELO, L L e SALVADORI, Maria Cecília Barbosa da Silveira e CATTANI, Mauro Sérgio Dorsa. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters, 2003Tradução . . Acesso em: 23 abr. 2024. -
APA
Melo, L. L., Salvadori, M. C. B. da S., & Cattani, M. S. D. (2003). Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters. -
NLM
Melo LL, Salvadori MCB da S, Cattani MSD. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters. 2003 ;[citado 2024 abr. 23 ] -
Vancouver
Melo LL, Salvadori MCB da S, Cattani MSD. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters. 2003 ;[citado 2024 abr. 23 ] - Critical exponent measurement of poor quality diamond films
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