New opportunities in X-ray characterization of semiconductors (2003)
- Autor:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Assuntos: SEMICONDUTORES; RAIOS X
- Idioma: Inglês
- Imprenta:
- Editora: Elsevier Science
- Local: Amsterdam
- Data de publicação: 2003
- Fonte:
- Título do periódico: Book of Abstracts
- Nome do evento: International Conference on Defects in Semiconductors
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ABNT
MORELHÃO, Sérgio Luiz. New opportunities in X-ray characterization of semiconductors. 2003, Anais.. Amsterdam: Elsevier Science, 2003. . Acesso em: 18 abr. 2024. -
APA
Morelhão, S. L. (2003). New opportunities in X-ray characterization of semiconductors. In Book of Abstracts. Amsterdam: Elsevier Science. -
NLM
Morelhão SL. New opportunities in X-ray characterization of semiconductors. Book of Abstracts. 2003 ;[citado 2024 abr. 18 ] -
Vancouver
Morelhão SL. New opportunities in X-ray characterization of semiconductors. Book of Abstracts. 2003 ;[citado 2024 abr. 18 ] - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- An x-ray diffractometer for accurate structural invariant phase determination
- Invariant phase determination by genetic algorithm
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- An x-ray topography study of the dendritic web silicon growth process
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
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