Enhanced X-ray phase determination by three-beam diffraction (2002)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: DIFRAÇÃO POR RAIOS X; ESTRUTURA ELETRÔNICA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Physical Review Letters
- ISSN: 0031-9007
- Volume/Número/Paginação/Ano: v. 89, n. 1, p. 15501/1-15501/4, 2002
-
ABNT
MORELHÃO, Sérgio Luiz e KYCIA, Stefan. Enhanced X-ray phase determination by three-beam diffraction. Physical Review Letters, v. 89, n. 1, p. 15501/1-15501/4, 2002Tradução . . Disponível em: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips. Acesso em: 23 abr. 2024. -
APA
Morelhão, S. L., & Kycia, S. (2002). Enhanced X-ray phase determination by three-beam diffraction. Physical Review Letters, 89( 1), 15501/1-15501/4. Recuperado de http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips -
NLM
Morelhão SL, Kycia S. Enhanced X-ray phase determination by three-beam diffraction [Internet]. Physical Review Letters. 2002 ; 89( 1): 15501/1-15501/4.[citado 2024 abr. 23 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips -
Vancouver
Morelhão SL, Kycia S. Enhanced X-ray phase determination by three-beam diffraction [Internet]. Physical Review Letters. 2002 ; 89( 1): 15501/1-15501/4.[citado 2024 abr. 23 ] Available from: http://ojps.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=PRLTAO000089000001015501000001&idtype=cvips - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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