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Artigo de periodico
Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs (2014)
Teixeira, Fernando Ferrari; Martino, João Antonio ; Bordallo, Caio Cesar Mendes ; Silveira, Marcilei Aparecida Guazzelli da; Agopian, Paula Ghedini Der ; Simoen, Eddy ; Claeys, Cor
Fonte: Journal of Integrated Circuits and Systems. Unidade: EP
Assuntos: MICROELETRÔNICA, RAIOS X
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ABNT
TEIXEIRA, Fernando Ferrari et al. Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs. Journal of Integrated Circuits and Systems, v. 9, n. 2, p. 97-102, 2014Tradução . . Disponível em: https://doi.org/10.29292/jics.v9i2.394. Acesso em: 15 nov. 2025.
APA
Teixeira, F. F., Martino, J. A., Bordallo, C. C. M., Silveira, M. A. G. da, Agopian, P. G. D., Simoen, E., & Claeys, C. (2014). Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs. Journal of Integrated Circuits and Systems, 9( 2), 97-102. doi:10.29292/jics.v9i2.394
NLM
Teixeira FF, Martino JA, Bordallo CCM, Silveira MAG da, Agopian PGD, Simoen E, Claeys C. Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs [Internet]. Journal of Integrated Circuits and Systems. 2014 ; 9( 2): 97-102.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v9i2.394
Vancouver
Teixeira FF, Martino JA, Bordallo CCM, Silveira MAG da, Agopian PGD, Simoen E, Claeys C. Parasitic conduction response to X-ray radiation in unstrained and strained triple-gate SOI MuGFETs [Internet]. Journal of Integrated Circuits and Systems. 2014 ; 9( 2): 97-102.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v9i2.394
Artigo de periodico
Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results (2014)
Nissimoff, Albert; Claeys, Cor ; Aoulaiche, Marc; Sasaki, Karen Lucia Mayumi; Simoen, Eddy ; Martino, João Antonio
Fonte: Journal of Integrated Circuits and Systems. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
NISSIMOFF, Albert et al. Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results. Journal of Integrated Circuits and Systems, v. 9, n. 2, p. 91-96, 2014Tradução . . Disponível em: https://doi.org/10.29292/jics.v9i2.393. Acesso em: 15 nov. 2025.
APA
Nissimoff, A., Claeys, C., Aoulaiche, M., Sasaki, K. L. M., Simoen, E., & Martino, J. A. (2014). Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results. Journal of Integrated Circuits and Systems, 9( 2), 91-96. doi:10.29292/jics.v9i2.393
NLM
Nissimoff A, Claeys C, Aoulaiche M, Sasaki KLM, Simoen E, Martino JA. Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results [Internet]. Journal of Integrated Circuits and Systems. 2014 ; 9( 2): 91-96.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v9i2.393
Vancouver
Nissimoff A, Claeys C, Aoulaiche M, Sasaki KLM, Simoen E, Martino JA. Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results [Internet]. Journal of Integrated Circuits and Systems. 2014 ; 9( 2): 91-96.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v9i2.393
Artigo de periodico
Fabrication of Ti-Si-Ti metal-semiconductor-metal photodetectors using low temperature rapid thermal annealing (2007)
Ohta, Ricardo Luís; Viana, Carlos Eduardo; Morimoto, Nilton Itiro ; Borges, Ben-Hur Viana
Fonte: Journal of Integrated Circuits and Systems. Unidades: EP, EESC
Assuntos: MICROELETRÔNICA, CIÊNCIA DA COMPUTAÇÃO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
OHTA, Ricardo Luís et al. Fabrication of Ti-Si-Ti metal-semiconductor-metal photodetectors using low temperature rapid thermal annealing. Journal of Integrated Circuits and Systems, v. 2, n. 2, 2007Tradução . . Acesso em: 15 nov. 2025.
APA
Ohta, R. L., Viana, C. E., Morimoto, N. I., & Borges, B. -H. V. (2007). Fabrication of Ti-Si-Ti metal-semiconductor-metal photodetectors using low temperature rapid thermal annealing. Journal of Integrated Circuits and Systems, 2( 2).
NLM
Ohta RL, Viana CE, Morimoto NI, Borges B-HV. Fabrication of Ti-Si-Ti metal-semiconductor-metal photodetectors using low temperature rapid thermal annealing. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2025 nov. 15 ]
Vancouver
Ohta RL, Viana CE, Morimoto NI, Borges B-HV. Fabrication of Ti-Si-Ti metal-semiconductor-metal photodetectors using low temperature rapid thermal annealing. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2025 nov. 15 ]
Artigo de periodico
Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric (2007)
Albertin, Katia Franklin ; Valle, M A; Pereyra, Inés
Fonte: Journal of Integrated Circuits and Systems. Unidade: EP
Assuntos: MICROELETRÔNICA, CIÊNCIA DA COMPUTAÇÃO
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ABNT
ALBERTIN, Katia Franklin e VALLE, M A e PEREYRA, Inés. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems, v. 2, n. 2, 2007Tradução . . Acesso em: 15 nov. 2025.
APA
Albertin, K. F., Valle, M. A., & Pereyra, I. (2007). Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems, 2( 2).
NLM
Albertin KF, Valle MA, Pereyra I. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2025 nov. 15 ]
Vancouver
Albertin KF, Valle MA, Pereyra I. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2025 nov. 15 ]
Artigo de periodico
Plasma parameters obtained with planar probe and optical emission spectroscopy (2007)
Daltrini, Andre M; Moshkalev, Stanislav; Swart, Laura; Verdonck, Patrick Bernard
Fonte: Journal of Integrated Circuits and Systems. Unidade: EP
Assuntos: MICROELETRÔNICA, CIÊNCIA DA COMPUTAÇÃO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
DALTRINI, Andre M et al. Plasma parameters obtained with planar probe and optical emission spectroscopy. Journal of Integrated Circuits and Systems, v. 2, n. 2, 2007Tradução . . Acesso em: 15 nov. 2025.
APA
Daltrini, A. M., Moshkalev, S., Swart, L., & Verdonck, P. B. (2007). Plasma parameters obtained with planar probe and optical emission spectroscopy. Journal of Integrated Circuits and Systems, 2( 2).
NLM
Daltrini AM, Moshkalev S, Swart L, Verdonck PB. Plasma parameters obtained with planar probe and optical emission spectroscopy. Journal of Integrated Circuits and Systems. 2007 ; 2( 2):[citado 2025 nov. 15 ]
Vancouver
Daltrini AM, Moshkalev S, Swart L, Verdonck PB. Plasma parameters obtained with planar probe and optical emission spectroscopy. Journal of Integrated Circuits and Systems. 2007 ; 2( 2):[citado 2025 nov. 15 ]

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