Study of KCl+x% In and KCl+y% TlCl thin films (1998)
Rubo, Elisabete Aparecida Andrello; Oliveira, L.; Siu Li, Máximo 
Source: Radiation Effects and Defects in Solids. Unidade: IFSC
Subjects: MATÉRIA CONDENSADA (PROPRIEDADES ELÉTRICAS), SEMICONDUTORES, MATÉRIA CONDENSADA
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RUBO, Elisabete Aparecida Andrello e OLIVEIRA, L. e SIU LI, Máximo. Study of KCl+x% In and KCl+y% TlCl thin films. Radiation Effects and Defects in Solids, v. 147, p. 83-91, 1998Tradução . . Disponível em: https://doi.org/10.1080/10420159808226391. Acesso em: 15 nov. 2025.APA
Rubo, E. A. A., Oliveira, L., & Siu Li, M. (1998). Study of KCl+x% In and KCl+y% TlCl thin films. Radiation Effects and Defects in Solids, 147, 83-91. doi:10.1080/10420159808226391NLM
Rubo EAA, Oliveira L, Siu Li M. Study of KCl+x% In and KCl+y% TlCl thin films [Internet]. Radiation Effects and Defects in Solids. 1998 ; 147 83-91.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1080/10420159808226391Vancouver
Rubo EAA, Oliveira L, Siu Li M. Study of KCl+x% In and KCl+y% TlCl thin films [Internet]. Radiation Effects and Defects in Solids. 1998 ; 147 83-91.[citado 2025 nov. 15 ] Available from: https://doi.org/10.1080/10420159808226391
