Effective layer pruning through similarity metric perspective (2025)
Pons, Ian; Yamamoto, Bruno Lopes; Reali Costa, Anna Helena 
; Correia, Artur Jordão Lima
Fonte: Lecture Notes in Computer Science. Nome do evento: International Conference on Pattern Recognition - ICPR 2024:Proceedings-Part V. Unidade: EP
Assuntos: APRENDIZAGEM PROFUNDA, REDES NEURAIS, ESPAÇOS MÉTRICOS
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ABNT
PONS, Ian et al. Effective layer pruning through similarity metric perspective. Lecture Notes in Computer Science. Cham: Springer. Disponível em: https://doi.org/10.1007/978-3-031-78169-8_8. Acesso em: 01 dez. 2025. , 2025APA
Pons, I., Yamamoto, B. L., Reali Costa, A. H., & Correia, A. J. L. (2025). Effective layer pruning through similarity metric perspective. Lecture Notes in Computer Science. Cham: Springer. doi:10.1007/978-3-031-78169-8_28NLM
Pons I, Yamamoto BL, Reali Costa AH, Correia AJL. Effective layer pruning through similarity metric perspective [Internet]. Lecture Notes in Computer Science. 2025 ; 15305 423-438.[citado 2025 dez. 01 ] Available from: https://doi.org/10.1007/978-3-031-78169-8_8Vancouver
Pons I, Yamamoto BL, Reali Costa AH, Correia AJL. Effective layer pruning through similarity metric perspective [Internet]. Lecture Notes in Computer Science. 2025 ; 15305 423-438.[citado 2025 dez. 01 ] Available from: https://doi.org/10.1007/978-3-031-78169-8_8
