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Artigo de periodico
Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study (2024)
Valério, Adriana ; Trindade, Fabiane de Jesus ; Penacchio, Rafaela Felix da Silva ; Cisi, Bria; Damasceno, Sergio; Estradiote, Maurício Bastos ; Rodella, Cristiane Barbieri ; Ferlauto, Andre Santarosa ; Kycia, Stefan W ; Morelhão, Sergio Luiz
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, NANOPARTÍCULAS
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ABNT
VALÉRIO, Adriana et al. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study. Journal of Applied Crystallography, v. 57, p. 793-807, 2024Tradução . . Disponível em: https://doi.org/10.1107/S1600576724003108. Acesso em: 01 nov. 2024.
APA
Valério, A., Trindade, F. de J., Penacchio, R. F. da S., Cisi, B., Damasceno, S., Estradiote, M. B., et al. (2024). Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study. Journal of Applied Crystallography, 57, 793-807. doi:10.1107/S1600576724003108
NLM
Valério A, Trindade F de J, Penacchio RF da S, Cisi B, Damasceno S, Estradiote MB, Rodella CB, Ferlauto AS, Kycia SW, Morelhão SL. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study [Internet]. Journal of Applied Crystallography. 2024 ; 57 793-807.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576724003108
Vancouver
Valério A, Trindade F de J, Penacchio RF da S, Cisi B, Damasceno S, Estradiote MB, Rodella CB, Ferlauto AS, Kycia SW, Morelhão SL. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study [Internet]. Journal of Applied Crystallography. 2024 ; 57 793-807.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576724003108
Artigo de periodico
Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix (2023)
Kellermann, Guinther; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: FILMES FINOS, NANOPARTÍCULAS
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ABNT
KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, v. 56, p. 927-938, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576723004570. Acesso em: 01 nov. 2024.
APA
Kellermann, G., & Craievich, A. F. (2023). Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, 56, 927-938. doi:10.1107/S1600576723004570
NLM
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576723004570
Vancouver
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576723004570
Trabalho de evento-anais periodico
(U)SAXS characterization of porous microstructure of chert: insights into organic matter preservation (2023)
Montecinos Muñoz, Patrício Rodrigo ; Ilavsky, Jan; Newville, Matthew ; Wetter, Niklaus Ursus ; Lourenço, Rafael André ; Andrade, Marcelo Barbosa de ; Martins, Tereza da Silva ; Dipold, Jessica; Freitas, Anderson Zanardi de ; Silva, Luis Carlos Cides da; Oliveira, Cristiano Luis Pinto de
Source: Journal of Applied Crystallography. Conference titles: International Small-Angle Scattering Conference - SAS. Unidades: IGC, IO, IF, IFSC
Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, ROCHAS SEDIMENTARES, MATÉRIA ORGÂNICA DO SOLO
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MONTECINOS MUÑOZ, Patrício Rodrigo et al. (U)SAXS characterization of porous microstructure of chert: insights into organic matter preservation. Journal of Applied Crystallography. Chichester: Instituto de Geociências, Universidade de São Paulo. Disponível em: https://doi.org/10.1107/S1600576723008889. Acesso em: 01 nov. 2024. , 2023
APA
Montecinos Muñoz, P. R., Ilavsky, J., Newville, M., Wetter, N. U., Lourenço, R. A., Andrade, M. B. de, et al. (2023). (U)SAXS characterization of porous microstructure of chert: insights into organic matter preservation. Journal of Applied Crystallography. Chichester: Instituto de Geociências, Universidade de São Paulo. doi:10.1107/S1600576723008889
NLM
Montecinos Muñoz PR, Ilavsky J, Newville M, Wetter NU, Lourenço RA, Andrade MB de, Martins T da S, Dipold J, Freitas AZ de, Silva LCC da, Oliveira CLP de. (U)SAXS characterization of porous microstructure of chert: insights into organic matter preservation [Internet]. Journal of Applied Crystallography. 2023 ; 56 1692-1706 + supporting information: sup-1-sup-18.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576723008889
Vancouver
Montecinos Muñoz PR, Ilavsky J, Newville M, Wetter NU, Lourenço RA, Andrade MB de, Martins T da S, Dipold J, Freitas AZ de, Silva LCC da, Oliveira CLP de. (U)SAXS characterization of porous microstructure of chert: insights into organic matter preservation [Internet]. Journal of Applied Crystallography. 2023 ; 56 1692-1706 + supporting information: sup-1-sup-18.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576723008889
Artigo de periodico
Retrieving the size distribution of SBA-15 mesopores from small-angle X-ray scattering data using a Monte Carlo method (2023)
Tan, Xiangyin; Gerbelli, Barbara Bianca ; Fantini, Márcia Carvalho de Abreu ; Oliveira, Cristiano Luis Pinto de ; Bordallo, Heloisa Nunes ; Oseliero Filho, Pedro Leonidas
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: MÉTODO DE MONTE CARLO
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ABNT
TAN, Xiangyin et al. Retrieving the size distribution of SBA-15 mesopores from small-angle X-ray scattering data using a Monte Carlo method. Journal of Applied Crystallography, v. 56, p. 1381–1391, 2023Tradução . . Disponível em: https://doi.org/10.1107/S160057672300691X. Acesso em: 01 nov. 2024.
APA
Tan, X., Gerbelli, B. B., Fantini, M. C. de A., Oliveira, C. L. P. de, Bordallo, H. N., & Oseliero Filho, P. L. (2023). Retrieving the size distribution of SBA-15 mesopores from small-angle X-ray scattering data using a Monte Carlo method. Journal of Applied Crystallography, 56, 1381–1391. doi:10.1107/S160057672300691X
NLM
Tan X, Gerbelli BB, Fantini MC de A, Oliveira CLP de, Bordallo HN, Oseliero Filho PL. Retrieving the size distribution of SBA-15 mesopores from small-angle X-ray scattering data using a Monte Carlo method [Internet]. Journal of Applied Crystallography. 2023 ; 56 1381–1391.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S160057672300691X
Vancouver
Tan X, Gerbelli BB, Fantini MC de A, Oliveira CLP de, Bordallo HN, Oseliero Filho PL. Retrieving the size distribution of SBA-15 mesopores from small-angle X-ray scattering data using a Monte Carlo method [Internet]. Journal of Applied Crystallography. 2023 ; 56 1381–1391.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S160057672300691X
Artigo de periodico
Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film (2023)
Costa, Daniel da Silva; Kellermann, Guinther; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: FILMES FINOS
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ABNT
COSTA, Daniel da Silva e KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film. Journal of Applied Crystallography, v. 56, p. 95-102, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576722010974. Acesso em: 01 nov. 2024.
APA
Costa, D. da S., Kellermann, G., & Craievich, A. F. (2023). Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film. Journal of Applied Crystallography, 56, 95-102. doi:10.1107/S1600576722010974
NLM
Costa D da S, Kellermann G, Craievich AF. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film [Internet]. Journal of Applied Crystallography. 2023 ; 56 95-102.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576722010974
Vancouver
Costa D da S, Kellermann G, Craievich AF. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film [Internet]. Journal of Applied Crystallography. 2023 ; 56 95-102.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576722010974
Artigo de periodico
Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique (2020)
Kellermann, G.; Pereira, F. L. C.; Craievich, A. F.
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: RADIAÇÃO SINCROTRON, CRISTALOGRAFIA DE RAIOS X, NANOPARTÍCULAS, TERMODINÂMICA, ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS
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ABNT
KELLERMANN, G. e PEREIRA, F. L. C. e CRAIEVICH, A. F. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, v. 53, n. 2, p. 455-463, 2020Tradução . . Disponível em: https://doi.org/10.1107/S1600576720002101. Acesso em: 01 nov. 2024.
APA
Kellermann, G., Pereira, F. L. C., & Craievich, A. F. (2020). Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, 53( 2), 455-463. doi:10.1107/S1600576720002101
NLM
Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576720002101
Vancouver
Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576720002101
Artigo de periodico
In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass (2018)
Gorgeski, A; Craievich, Aldo Felix; Correa, L M; Montoro, Luciano Andrey; Kellermann, Guinther
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, NANOPARTÍCULAS, MICROSCOPIA ELETRÔNICA
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ABNT
GORGESKI, A et al. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography, v. 51, p. 395-405, 2018Tradução . . Disponível em: https://doi.org/10.1107/S1600576718001462. Acesso em: 01 nov. 2024.
APA
Gorgeski, A., Craievich, A. F., Correa, L. M., Montoro, L. A., & Kellermann, G. (2018). In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography, 51, 395-405. doi:10.1107/S1600576718001462
NLM
Gorgeski A, Craievich AF, Correa LM, Montoro LA, Kellermann G. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass [Internet]. Journal of Applied Crystallography. 2018 ; 51 395-405.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576718001462
Vancouver
Gorgeski A, Craievich AF, Correa LM, Montoro LA, Kellermann G. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass [Internet]. Journal of Applied Crystallography. 2018 ; 51 395-405.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576718001462
Artigo de periodico
X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements (2017)
Morelhao, Sergio Luiz; Remédios, Claudio Marcio Rocha; Calligaris, Guilherme Andrade; Nisbet, Gareth
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, RADIAÇÃO SINCROTRON
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ABNT
MORELHAO, Sergio Luiz et al. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, v. 50, n. 3, p. 689-700, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717004757. Acesso em: 01 nov. 2024.
APA
Morelhao, S. L., Remédios, C. M. R., Calligaris, G. A., & Nisbet, G. (2017). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, 50( 3), 689-700. doi:10.1107/S1600576717004757
NLM
Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576717004757
Vancouver
Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576717004757
Artigo de periodico
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis (2017)
Morelhao, Sergio Luiz; Fornari, Celso I; Rappl, Paulo Henrique de Oliveira; Abramof, Eduardo
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, MATERIAIS NANOESTRUTURADOS
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ABNT
MORELHAO, Sergio Luiz et al. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, v. 50, n. 2, p. 399-410, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717000760. Acesso em: 01 nov. 2024.
APA
Morelhao, S. L., Fornari, C. I., Rappl, P. H. de O., & Abramof, E. (2017). Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, 50( 2), 399-410. doi:10.1107/S1600576717000760
NLM
Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576717000760
Vancouver
Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576717000760
Artigo de periodico
Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range (2017)
Degenhardt, Hermann Franz ; Kellermann, Guinther; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
DEGENHARDT, Hermann Franz e KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range. Journal of Applied Crystallography, v. 50, p. 1590-1600, 2017Tradução . . Disponível em: http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7. Acesso em: 01 nov. 2024.
APA
Degenhardt, H. F., Kellermann, G., & Craievich, A. F. (2017). Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range. Journal of Applied Crystallography, 50, 1590-1600. doi:10.1107/S1600576717012997
NLM
Degenhardt HF, Kellermann G, Craievich AF. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range [Internet]. Journal of Applied Crystallography. 2017 ; 50 1590-1600.[citado 2024 nov. 01 ] Available from: http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7
Vancouver
Degenhardt HF, Kellermann G, Craievich AF. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range [Internet]. Journal of Applied Crystallography. 2017 ; 50 1590-1600.[citado 2024 nov. 01 ] Available from: http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7
Artigo de periodico
Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)
Domagala, Jaroslaw Z.; Sarzynski, Marcin; Mazdziarz, Marcin; Dluzewski, Pawel; Leszczynski, Michal; Morelhao, Sergio Luiz
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
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ABNT
DOMAGALA, Jaroslaw Z. et al. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, v. 49, n. ju 2016, p. 798-805, 2016Tradução . . Disponível em: https://doi.org/10.1107/S1600576716004441. Acesso em: 01 nov. 2024.
APA
Domagala, J. Z., Sarzynski, M., Mazdziarz, M., Dluzewski, P., Leszczynski, M., & Morelhao, S. L. (2016). Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, 49( ju 2016), 798-805. doi:10.1107/S1600576716004441
NLM
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576716004441
Vancouver
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576716004441
Artigo de periodico
Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning (2014)
Amirkhanyan, Zohrab G.; Remédios, Claúdio M. R.; Mascarenhas, Yvonne Primerano ; Morelhão, Sérgio L.
Source: Journal of Applied Crystallography. Unidade: IFSC
Subjects: CRISTALOGRAFIA, RAIOS X
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ABNT
AMIRKHANYAN, Zohrab G. et al. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, v. 47, p. 160-165, 2014Tradução . . Disponível em: https://doi.org/10.1107/S1600576713028677. Acesso em: 01 nov. 2024.
APA
Amirkhanyan, Z. G., Remédios, C. M. R., Mascarenhas, Y. P., & Morelhão, S. L. (2014). Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, 47, 160-165. doi:10.1107/S1600576713028677
NLM
Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576713028677
Vancouver
Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576713028677
Artigo de periodico
Modelling of high-symmetry nanoscale particles by small-angle scattering (2014)
Alves, Cássio ; Pedersen, Jan Skov; Oliveira, Cristiano Luis Pinto de
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: RAIOS X, MACROMOLÉCULA
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ABNT
ALVES, Cássio e PEDERSEN, Jan Skov e OLIVEIRA, Cristiano Luis Pinto de. Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, v. 47, n. ja 2014, p. 84-94, 2014Tradução . . Disponível em: https://doi.org/10.1107/S1600576713028549. Acesso em: 01 nov. 2024.
APA
Alves, C., Pedersen, J. S., & Oliveira, C. L. P. de. (2014). Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, 47( ja 2014), 84-94. doi:10.1107/S1600576713028549
NLM
Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering [Internet]. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576713028549
Vancouver
Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering [Internet]. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S1600576713028549
Artigo de periodico
CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose (2013)
Oliveira, Rafael P; Driemeier, Carlos Eduardo
Source: Journal of Applied Crystallography. Unidade: BIOENERGIA
Subjects: CELULOSE, CRISTALOGRAFIA ESTRUTURAL, DIFRAÇÃO POR RAIOS X
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ABNT
OLIVEIRA, Rafael P e DRIEMEIER, Carlos Eduardo. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose. Journal of Applied Crystallography, v. 46, p. 1196-1210, 2013Tradução . . Disponível em: https://doi.org/10.1107/S0021889813014805. Acesso em: 01 nov. 2024.
APA
Oliveira, R. P., & Driemeier, C. E. (2013). CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose. Journal of Applied Crystallography, 46, 1196-1210. doi:10.1107/S0021889813014805
NLM
Oliveira RP, Driemeier CE. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose [Internet]. Journal of Applied Crystallography. 2013 ; 46 1196-1210.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889813014805
Vancouver
Oliveira RP, Driemeier CE. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose [Internet]. Journal of Applied Crystallography. 2013 ; 46 1196-1210.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889813014805
Artigo de periodico
Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials (2011)
Driemeier, Carlos Eduardo ; Calligaris, Guilherme A
Source: Journal of Applied Crystallography. Unidade: BIOENERGIA
Subjects: CELULOSE, CRISTALOGRAFIA ESTRUTURAL, DIFRAÇÃO POR RAIOS X
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ABNT
DRIEMEIER, Carlos Eduardo e CALLIGARIS, Guilherme A. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials. Journal of Applied Crystallography, v. 44, p. 184-192, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889810043955. Acesso em: 01 nov. 2024.
APA
Driemeier, C. E., & Calligaris, G. A. (2011). Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials. Journal of Applied Crystallography, 44, 184-192. doi:10.1107/S0021889810043955
NLM
Driemeier CE, Calligaris GA. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials [Internet]. Journal of Applied Crystallography. 2011 ; 44 184-192.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889810043955
Vancouver
Driemeier CE, Calligaris GA. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials [Internet]. Journal of Applied Crystallography. 2011 ; 44 184-192.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889810043955
Artigo de periodico
Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering (2011)
Jensen, Grethe Vestergaard; Oliveira, Cristiano L. P. de
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
JENSEN, Grethe Vestergaard e OLIVEIRA, Cristiano L. P. de. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering. Journal of Applied Crystallography, v. 44, n. 3, p. 473-482, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889811013343. Acesso em: 01 nov. 2024.
APA
Jensen, G. V., & Oliveira, C. L. P. de. (2011). Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering. Journal of Applied Crystallography, 44( 3), 473-482. doi:10.1107/S0021889811013343
NLM
Jensen GV, Oliveira CLP de. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering [Internet]. Journal of Applied Crystallography. 2011 ; 44( 3): 473-482.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889811013343
Vancouver
Jensen GV, Oliveira CLP de. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering [Internet]. Journal of Applied Crystallography. 2011 ; 44( 3): 473-482.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889811013343
Artigo de periodico
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals (2011)
Morelhão, Sergio L ; Remédios, C M R; Freitas, Raul O ; Santos, A O dos
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, Sergio L et al. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, v. fe 2011, n. 1, p. 93-101, 2011Tradução . . Disponível em: https://doi.org/10.1107/S0021889810042391. Acesso em: 01 nov. 2024.
APA
Morelhão, S. L., Remédios, C. M. R., Freitas, R. O., & Santos, A. O. dos. (2011). X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, fe 2011( 1), 93-101. doi:10.1107/S0021889810042391
NLM
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889810042391
Vancouver
Morelhão SL, Remédios CMR, Freitas RO, Santos AO dos. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals [Internet]. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/S0021889810042391
Artigo de periodico
Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) (2010)
Kellermann, Guinther; Rodriguez, Eugenio; Jimenez, Ernesto; Cesar, Carlos Lenz; Barbosa, Luiz Carlos; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X, SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
KELLERMANN, Guinther et al. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, v. 43, p. 385-393, 2010Tradução . . Disponível em: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf. Acesso em: 01 nov. 2024.
APA
Kellermann, G., Rodriguez, E., Jimenez, E., Cesar, C. L., Barbosa, L. C., & Craievich, A. F. (2010). Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, 43, 385-393. Recuperado de http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
NLM
Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) [Internet]. Journal of Applied Crystallography. 2010 ; 43 385-393.[citado 2024 nov. 01 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
Vancouver
Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) [Internet]. Journal of Applied Crystallography. 2010 ; 43 385-393.[citado 2024 nov. 01 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
Artigo de periodico
Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders (2010)
Acunã, Leandro M; Lamas, Diego G; Fuentes, Rodolfo O; Fábregas,, Ismael O; Fantini, Márcia Carvalho de Abreu ; Craievich, Aldo Felix; Prado, Rogério J
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: DIFRAÇÃO POR RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ACUNÃ, Leandro M et al. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography, v. 43, n. 2, p. 227-236, 2010Tradução . . Disponível em: http://onlinelibrary.wiley.com/doi/10.1107/S0021889809054983/pdf. Acesso em: 01 nov. 2024.
APA
Acunã, L. M., Lamas, D. G., Fuentes, R. O., Fábregas,, Fantini, M. C. de A., Craievich, A. F., & Prado, R. J. (2010). Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography, 43( 2), 227-236. Recuperado de http://onlinelibrary.wiley.com/doi/10.1107/S0021889809054983/pdf
NLM
Acunã LM, Lamas DG, Fuentes RO, Fábregas, Fantini MC de A, Craievich AF, Prado RJ. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders [Internet]. Journal of Applied Crystallography. 2010 ; 43( 2): 227-236.[citado 2024 nov. 01 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889809054983/pdf
Vancouver
Acunã LM, Lamas DG, Fuentes RO, Fábregas, Fantini MC de A, Craievich AF, Prado RJ. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders [Internet]. Journal of Applied Crystallography. 2010 ; 43( 2): 227-236.[citado 2024 nov. 01 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889809054983/pdf
Artigo de periodico
Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy (2009)
Souza Neto, Narcizo M; Ramos, Aline Y; Tolentino, Helio C N; Martins, Alessandro; Santos, A. D.
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, SUPERFÍCIE FÍSICA, LUMINESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOUZA NETO, Narcizo M et al. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, v. 42, n. 6, p. 1158-1164, 2009Tradução . . Disponível em: https://doi.org/10.1107/s0021889809042678. Acesso em: 01 nov. 2024.
APA
Souza Neto, N. M., Ramos, A. Y., Tolentino, H. C. N., Martins, A., & Santos, A. D. (2009). Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, 42( 6), 1158-1164. doi:10.1107/s0021889809042678
NLM
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/s0021889809042678
Vancouver
Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.[citado 2024 nov. 01 ] Available from: https://doi.org/10.1107/s0021889809042678

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