Mn impurities in Si: stability on bulk and on surface (2003)
Source: Book of Abstracts II (Poster). Conference titles: International Conference on Defects in Semiconductors. Unidade: IF
Subjects: SEMICONDUTORES, FERROMAGNETISMO
ABNT
DALPIAN, G. M. e SILVA, Antonio Jose Roque da e FAZZIO, Adalberto. Mn impurities in Si: stability on bulk and on surface. 2003, Anais.. Amsterdam: Elsevier Science, 2003. . Acesso em: 04 nov. 2024.APA
Dalpian, G. M., Silva, A. J. R. da, & Fazzio, A. (2003). Mn impurities in Si: stability on bulk and on surface. In Book of Abstracts II (Poster). Amsterdam: Elsevier Science.NLM
Dalpian GM, Silva AJR da, Fazzio A. Mn impurities in Si: stability on bulk and on surface. Book of Abstracts II (Poster). 2003 ;[citado 2024 nov. 04 ]Vancouver
Dalpian GM, Silva AJR da, Fazzio A. Mn impurities in Si: stability on bulk and on surface. Book of Abstracts II (Poster). 2003 ;[citado 2024 nov. 04 ]