CUBIC GaN:Si layers investigated by raman scattering spectroscopy (2001)
Source: Resumos. Conference titles: Encontro Nacional de Física da Matéria Condensada. Unidade: IF
Subjects: SEMICONDUTORES, EFEITO MOSSBAUER, ESPECTROSCOPIA RAMAN, DIFRAÇÃO POR RAIOS X
ABNT
FERNANDEZ, Jose Rafael Leon et al. CUBIC GaN:Si layers investigated by raman scattering spectroscopy. 2001, Anais.. São Paulo: SBF, 2001. . Acesso em: 26 ago. 2024.APA
Fernandez, J. R. L., Silva, M. T. O., Pusep, Y. A., Chitta, V. A., Tabata, A., Noriega, O. C., et al. (2001). CUBIC GaN:Si layers investigated by raman scattering spectroscopy. In Resumos. São Paulo: SBF.NLM
Fernandez JRL, Silva MTO, Pusep YA, Chitta VA, Tabata A, Noriega OC, Leite JR, Abramof E, As DJ, Schikora D, Lischka K. CUBIC GaN:Si layers investigated by raman scattering spectroscopy. Resumos. 2001 ;[citado 2024 ago. 26 ]Vancouver
Fernandez JRL, Silva MTO, Pusep YA, Chitta VA, Tabata A, Noriega OC, Leite JR, Abramof E, As DJ, Schikora D, Lischka K. CUBIC GaN:Si layers investigated by raman scattering spectroscopy. Resumos. 2001 ;[citado 2024 ago. 26 ]