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Artigo de periodico
Minimum chip thickness determination by means of cutting force signal in micro endmilling (2018)
Dib, Marcel Henrique Militão; Duduch, Jaime Gilberto; Jasinevicius, Renato Goulart
Source: Precision Engineering. Unidade: EESC
Subjects: FRESAGEM, USINAGEM, ENGENHARIA MECÂNICA
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ABNT
DIB, Marcel Henrique Militão e DUDUCH, Jaime Gilberto e JASINEVICIUS, Renato Goulart. Minimum chip thickness determination by means of cutting force signal in micro endmilling. Precision Engineering, v. 51, p. 244-262, 2018Tradução . . Disponível em: https://doi.org/10.1016/j.precisioneng.2017.08.016. Acesso em: 31 out. 2024.
APA
Dib, M. H. M., Duduch, J. G., & Jasinevicius, R. G. (2018). Minimum chip thickness determination by means of cutting force signal in micro endmilling. Precision Engineering, 51, 244-262. doi:10.1016/j.precisioneng.2017.08.016
NLM
Dib MHM, Duduch JG, Jasinevicius RG. Minimum chip thickness determination by means of cutting force signal in micro endmilling [Internet]. Precision Engineering. 2018 ; 51 244-262.[citado 2024 out. 31 ] Available from: https://doi.org/10.1016/j.precisioneng.2017.08.016
Vancouver
Dib MHM, Duduch JG, Jasinevicius RG. Minimum chip thickness determination by means of cutting force signal in micro endmilling [Internet]. Precision Engineering. 2018 ; 51 244-262.[citado 2024 out. 31 ] Available from: https://doi.org/10.1016/j.precisioneng.2017.08.016
Artigo de periodico
Diamond turning of small Fresnel lens array in single crystal InSb (2013)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Cirino, Giuseppe Antonio; Pizani, Paulo Sergio
Source: Journal of Micromechanics and Microengineering. Unidade: EESC
Subjects: DIAMANTE, FERRAMENTAS, ESPECTROSCOPIA RAMAN, MICROSCOPIA ELETRÔNICA DE VARREDURA
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ABNT
JASINEVICIUS, Renato Goulart et al. Diamond turning of small Fresnel lens array in single crystal InSb. Journal of Micromechanics and Microengineering, v. 23, n. 5, p. 055025(1-12), 2013Tradução . . Disponível em: https://doi.org/10.1088/0960-1317/23/5/055025. Acesso em: 31 out. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., Cirino, G. A., & Pizani, P. S. (2013). Diamond turning of small Fresnel lens array in single crystal InSb. Journal of Micromechanics and Microengineering, 23( 5), 055025(1-12). doi:10.1088/0960-1317/23/5/055025
NLM
Jasinevicius RG, Duduch JG, Cirino GA, Pizani PS. Diamond turning of small Fresnel lens array in single crystal InSb [Internet]. Journal of Micromechanics and Microengineering. 2013 ; 23( 5): 055025(1-12).[citado 2024 out. 31 ] Available from: https://doi.org/10.1088/0960-1317/23/5/055025
Vancouver
Jasinevicius RG, Duduch JG, Cirino GA, Pizani PS. Diamond turning of small Fresnel lens array in single crystal InSb [Internet]. Journal of Micromechanics and Microengineering. 2013 ; 23( 5): 055025(1-12).[citado 2024 out. 31 ] Available from: https://doi.org/10.1088/0960-1317/23/5/055025
Artigo de periodico
Dependence of brittle-to-ductile transition on crystallographic direction in diamond turning of single-crystal silicon (2012)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Montanari, Luciana; Pizani, Paulo Sérgio
Source: Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. Unidade: EESC
Subjects: TORNEAMENTO, DIAMANTE, MUDANÇA DE FASE, CRISTALOGRAFIA
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ABNT
JASINEVICIUS, Renato Goulart et al. Dependence of brittle-to-ductile transition on crystallographic direction in diamond turning of single-crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, v. 226, n. 3, p. 445-458, 2012Tradução . . Disponível em: https://doi.org/10.1177/0954405411421108. Acesso em: 31 out. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., Montanari, L., & Pizani, P. S. (2012). Dependence of brittle-to-ductile transition on crystallographic direction in diamond turning of single-crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, 226( 3), 445-458. doi:10.1177/0954405411421108
NLM
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Dependence of brittle-to-ductile transition on crystallographic direction in diamond turning of single-crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2012 ; 226( 3): 445-458.[citado 2024 out. 31 ] Available from: https://doi.org/10.1177/0954405411421108
Vancouver
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Dependence of brittle-to-ductile transition on crystallographic direction in diamond turning of single-crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2012 ; 226( 3): 445-458.[citado 2024 out. 31 ] Available from: https://doi.org/10.1177/0954405411421108
Artigo de periodico
Diffraction gratings fabricated in DLC thin films (2010)
Cirino, Giuseppe Antonio; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard; Jasinevicius, Renato Goulart; Gonçalves Neto, Luiz
Source: Surface and Coatings Technology. Unidades: EP, EESC
Subjects: HOLOGRAMAS, ANÁLISE DE FOURIER, ÓPTICA
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ABNT
CIRINO, Giuseppe Antonio et al. Diffraction gratings fabricated in DLC thin films. Surface and Coatings Technology, v. 204, n. 18-19, p. 2966-2970, 2010Tradução . . Disponível em: https://doi.org/10.1016/j.surfcoat.2010.02.037. Acesso em: 31 out. 2024.
APA
Cirino, G. A., Mansano, R. D., Verdonck, P. B., Jasinevicius, R. G., & Gonçalves Neto, L. (2010). Diffraction gratings fabricated in DLC thin films. Surface and Coatings Technology, 204( 18-19), 2966-2970. doi:10.1016/j.surfcoat.2010.02.037
NLM
Cirino GA, Mansano RD, Verdonck PB, Jasinevicius RG, Gonçalves Neto L. Diffraction gratings fabricated in DLC thin films [Internet]. Surface and Coatings Technology. 2010 ; 204( 18-19): 2966-2970.[citado 2024 out. 31 ] Available from: https://doi.org/10.1016/j.surfcoat.2010.02.037
Vancouver
Cirino GA, Mansano RD, Verdonck PB, Jasinevicius RG, Gonçalves Neto L. Diffraction gratings fabricated in DLC thin films [Internet]. Surface and Coatings Technology. 2010 ; 204( 18-19): 2966-2970.[citado 2024 out. 31 ] Available from: https://doi.org/10.1016/j.surfcoat.2010.02.037
Artigo de periodico
Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon (2008)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Montanari, Luciana; Pizani, Paulo Sérgio
Source: Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. Unidade: EESC
Subjects: MUDANÇA DE FASE, ESPECTROSCOPIA RAMAN
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ABNT
JASINEVICIUS, Renato Goulart et al. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, v. 222, n. 9, p. 1065-1073, 2008Tradução . . Disponível em: https://doi.org/10.1243/09544054JEM1161. Acesso em: 31 out. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., Montanari, L., & Pizani, P. S. (2008). Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture, 222( 9), 1065-1073. doi:10.1243/09544054JEM1161
NLM
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2008 ; 222( 9): 1065-1073.[citado 2024 out. 31 ] Available from: https://doi.org/10.1243/09544054JEM1161
Vancouver
Jasinevicius RG, Duduch JG, Montanari L, Pizani PS. Phase transformation and residual stress probed by Raman spectroscopy in diamond-turned single crystal silicon [Internet]. Proceedings of Institution of Mechanical Engineers. Part B. Journal of Engineering Manufacture. 2008 ; 222( 9): 1065-1073.[citado 2024 out. 31 ] Available from: https://doi.org/10.1243/09544054JEM1161
Artigo de periodico
Annealing treatment of amorphous silicon generated by single point diamond turning (2007)
Jasinevicius, Renato Goulart; Pizani, Paulo Sérgio
Source: International Journal of Advanced Manufacturing Technology. Unidade: EESC
Subjects: SILICONE, DIAMANTE, RECOZIMENTO, ESPECTROSCOPIA RAMAN
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ABNT
JASINEVICIUS, Renato Goulart e PIZANI, Paulo Sérgio. Annealing treatment of amorphous silicon generated by single point diamond turning. International Journal of Advanced Manufacturing Technology, v. 34, n. 7-8, p. 680-688, 2007Tradução . . Disponível em: https://doi.org/10.1007/s00170-006-0650-z. Acesso em: 31 out. 2024.
APA
Jasinevicius, R. G., & Pizani, P. S. (2007). Annealing treatment of amorphous silicon generated by single point diamond turning. International Journal of Advanced Manufacturing Technology, 34( 7-8), 680-688. doi:10.1007/s00170-006-0650-z
NLM
Jasinevicius RG, Pizani PS. Annealing treatment of amorphous silicon generated by single point diamond turning [Internet]. International Journal of Advanced Manufacturing Technology. 2007 ; 34( 7-8): 680-688.[citado 2024 out. 31 ] Available from: https://doi.org/10.1007/s00170-006-0650-z
Vancouver
Jasinevicius RG, Pizani PS. Annealing treatment of amorphous silicon generated by single point diamond turning [Internet]. International Journal of Advanced Manufacturing Technology. 2007 ; 34( 7-8): 680-688.[citado 2024 out. 31 ] Available from: https://doi.org/10.1007/s00170-006-0650-z

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