Improving IoT module testability with test-driven development and machine learning (2021)
Hayashi, Victor Takashi 
; Ribeiro, Cairo Mateus Neves; Quintino Filho, Artino; Pita, Matheus Ancelmo Bonfim; Trazzi, Bruno Manias ; Estrella, Júlio Cezar ; Ruggiero, Wilson Vicente
Source: Proceedings. Conference titles: International Conference on Future Internet of Things and Cloud - FiCloud. Unidades: ICMC, EP, EACH
Subjects: INTERNET DAS COISAS, APRENDIZADO COMPUTACIONAL, PYTHON
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HAYASHI, Victor Takashi et al. Improving IoT module testability with test-driven development and machine learning. 2021, Anais.. Piscataway: IEEE, 2021. Disponível em: https://doi.org/10.1109/FiCloud49777.2021.00066. Acesso em: 15 nov. 2025.APA
Hayashi, V. T., Ribeiro, C. M. N., Quintino Filho, A., Pita, M. A. B., Trazzi, B. M., Estrella, J. C., & Ruggiero, W. V. (2021). Improving IoT module testability with test-driven development and machine learning. In Proceedings. Piscataway: IEEE. doi:10.1109/FiCloud49777.2021.00066NLM
Hayashi VT, Ribeiro CMN, Quintino Filho A, Pita MAB, Trazzi BM, Estrella JC, Ruggiero WV. Improving IoT module testability with test-driven development and machine learning [Internet]. Proceedings. 2021 ;[citado 2025 nov. 15 ] Available from: https://doi.org/10.1109/FiCloud49777.2021.00066Vancouver
Hayashi VT, Ribeiro CMN, Quintino Filho A, Pita MAB, Trazzi BM, Estrella JC, Ruggiero WV. Improving IoT module testability with test-driven development and machine learning [Internet]. Proceedings. 2021 ;[citado 2025 nov. 15 ] Available from: https://doi.org/10.1109/FiCloud49777.2021.00066
