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Filtros : "Low Temperature Electronics and High Temperature Superconductivity" Limpar

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  • Parte de monografia/livro

    Combined ΔL and series resistance extraction of LDD MOSFETs at 77 K (1995)

    Schreutelkamp, R; Martino, João Antonio ; Simoen, Eddy ; Deferm, L; Claeys, Cor

    Fonte: Low Temperature Electronics and High Temperature Superconductivity. Unidade: EP

    Assunto: MICROELETRÔNICA

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    • ABNT

      SCHREUTELKAMP, R et al. Combined ΔL and series resistance extraction of LDD MOSFETs at 77 K. Low Temperature Electronics and High Temperature Superconductivity. Tradução . Pennington: The Electrochemical Society, 1995. . . Acesso em: 23 nov. 2025.

    • APA

      Schreutelkamp, R., Martino, J. A., Simoen, E., Deferm, L., & Claeys, C. (1995). Combined ΔL and series resistance extraction of LDD MOSFETs at 77 K. In Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society.

    • NLM

      Schreutelkamp R, Martino JA, Simoen E, Deferm L, Claeys C. Combined ΔL and series resistance extraction of LDD MOSFETs at 77 K. In: Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society; 1995. [citado 2025 nov. 23 ]

    • Vancouver

      Schreutelkamp R, Martino JA, Simoen E, Deferm L, Claeys C. Combined ΔL and series resistance extraction of LDD MOSFETs at 77 K. In: Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society; 1995. [citado 2025 nov. 23 ]

  • Parte de monografia/livro

    Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures (1995)

    Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor

    Fonte: Low Temperature Electronics and High Temperature Superconductivity. Unidade: EP

    Assuntos: MICROELETRÔNICA, CIRCUITOS INTEGRADOS

    Como citar
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      MARTINO, João Antonio e SIMOEN, Eddy e CLAEYS, Cor. Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures. Low Temperature Electronics and High Temperature Superconductivity. Tradução . Pennington: The Electrochemical Society, 1995. . . Acesso em: 23 nov. 2025.

    • APA

      Martino, J. A., Simoen, E., & Claeys, C. (1995). Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures. In Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society.

    • NLM

      Martino JA, Simoen E, Claeys C. Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures. In: Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society; 1995. [citado 2025 nov. 23 ]

    • Vancouver

      Martino JA, Simoen E, Claeys C. Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures. In: Low Temperature Electronics and High Temperature Superconductivity. Pennington: The Electrochemical Society; 1995. [citado 2025 nov. 23 ]
  • 1

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