ReP USP - Resultado da busca

Artigo de periodico
Laser patterning a Chem-FET like device on a V2O5 xerogel film (2018)
Gonzalez Huila, Manuel Fernando ; Parússulo, André Luis Araújo; Gomez Armas, Luis Enrique ; Peres, Henrique Estanislau Maldonado ; Seabra, Antonio Carlos ; Ramírez Fernandez, Francisco Javier ; Araki, Koiti ; Toma, Henrique Eisi
Source: IEEE Sensors Journal. Unidades: EP, IQ
Subjects: VANÁDIO, MATERIAIS NANOESTRUTURADOS, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GONZALEZ HUILA, Manuel Fernando et al. Laser patterning a Chem-FET like device on a V2O5 xerogel film. IEEE Sensors Journal, v. 18, n. 4, p. 1358-1363, 2018Tradução . . Disponível em: https://doi.org/10.1109/JSEN.2017.2786082. Acesso em: 06 jun. 2024.
APA
Gonzalez Huila, M. F., Parússulo, A. L. A., Gomez Armas, L. E., Peres, H. E. M., Seabra, A. C., Ramírez Fernandez, F. J., et al. (2018). Laser patterning a Chem-FET like device on a V2O5 xerogel film. IEEE Sensors Journal, 18( 4), 1358-1363. doi:10.1109/JSEN.2017.2786082
NLM
Gonzalez Huila MF, Parússulo ALA, Gomez Armas LE, Peres HEM, Seabra AC, Ramírez Fernandez FJ, Araki K, Toma HE. Laser patterning a Chem-FET like device on a V2O5 xerogel film [Internet]. IEEE Sensors Journal. 2018 ; 18( 4): 1358-1363.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1109/JSEN.2017.2786082
Vancouver
Gonzalez Huila MF, Parússulo ALA, Gomez Armas LE, Peres HEM, Seabra AC, Ramírez Fernandez FJ, Araki K, Toma HE. Laser patterning a Chem-FET like device on a V2O5 xerogel film [Internet]. IEEE Sensors Journal. 2018 ; 18( 4): 1358-1363.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1109/JSEN.2017.2786082
Trabalho de evento-resumo
Electrical response of bentonite - vanadium oxide xerogels films for detection of components of automotive fuels (2005)
Hidalgo Falla, Maria del Pilar ; Peres, Henrique Estanislau Maldonado ; Honorato, Alexandre; Ramírez Fernandez, Francisco Javier ; Timm, Ronaldo Adriano; Toma, Henrique Eisi ; Araki, Koiti
Source: Final Program. Conference titles: Encontro da Sociedade Brasileira de Pesquisa em Materiais. Unidades: EP, IQ
Assunto: ELETROQUÍMICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
HIDALGO FALLA, Maria del Pilar et al. Electrical response of bentonite - vanadium oxide xerogels films for detection of components of automotive fuels. 2005, Anais.. Recife: Universitária UFPE, 2005. . Acesso em: 06 jun. 2024.
APA
Hidalgo Falla, M. del P., Peres, H. E. M., Honorato, A., Ramírez Fernandez, F. J., Timm, R. A., Toma, H. E., & Araki, K. (2005). Electrical response of bentonite - vanadium oxide xerogels films for detection of components of automotive fuels. In Final Program. Recife: Universitária UFPE.
NLM
Hidalgo Falla M del P, Peres HEM, Honorato A, Ramírez Fernandez FJ, Timm RA, Toma HE, Araki K. Electrical response of bentonite - vanadium oxide xerogels films for detection of components of automotive fuels. Final Program. 2005 ;[citado 2024 jun. 06 ]
Vancouver
Hidalgo Falla M del P, Peres HEM, Honorato A, Ramírez Fernandez FJ, Timm RA, Toma HE, Araki K. Electrical response of bentonite - vanadium oxide xerogels films for detection of components of automotive fuels. Final Program. 2005 ;[citado 2024 jun. 06 ]
Trabalho de evento
Optical properties of porous silicon for gas sensors application (2002)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier ; Rubim, Joel Camargo
Source: IBERSENSOR 2002. Conference titles: Congreso Iberoamericano de Sensores y Biosensores. Unidades: EP, IQ
Assunto: SENSORES ÓTICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier e RUBIM, Joel Camargo. Optical properties of porous silicon for gas sensors application. 2002, Anais.. Lima: Pontifícia Universidad Católica del Perú, 2002. . Acesso em: 06 jun. 2024.
APA
Salcedo, W. J., Ramírez Fernandez, F. J., & Rubim, J. C. (2002). Optical properties of porous silicon for gas sensors application. In IBERSENSOR 2002. Lima: Pontifícia Universidad Católica del Perú.
NLM
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Optical properties of porous silicon for gas sensors application. IBERSENSOR 2002. 2002 ;[citado 2024 jun. 06 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Optical properties of porous silicon for gas sensors application. IBERSENSOR 2002. 2002 ;[citado 2024 jun. 06 ]
Artigo de periodico
Changes in the porous silicon structure induced by laser radiation (2001)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier ; Rubim, Joel Camargo
Source: Journal of Raman Spectroscopy. Unidades: EP, IQ
Subjects: QUÍMICA ANALÍTICA, LUMINESCÊNCIA, ESPECTROSCOPIA RAMAN, FOTOLUMINESCÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier e RUBIM, Joel Camargo. Changes in the porous silicon structure induced by laser radiation. Journal of Raman Spectroscopy, v. 32, n. 3, p. 151-157, 2001Tradução . . Disponível em: https://doi.org/10.1002/jrs.668. Acesso em: 06 jun. 2024.
APA
Salcedo, W. J., Ramírez Fernandez, F. J., & Rubim, J. C. (2001). Changes in the porous silicon structure induced by laser radiation. Journal of Raman Spectroscopy, 32( 3), 151-157. doi:10.1002/jrs.668
NLM
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Changes in the porous silicon structure induced by laser radiation [Internet]. Journal of Raman Spectroscopy. 2001 ; 32( 3): 151-157.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1002/jrs.668
Vancouver
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Changes in the porous silicon structure induced by laser radiation [Internet]. Journal of Raman Spectroscopy. 2001 ; 32( 3): 151-157.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1002/jrs.668
Artigo de periodico
Polarization effects on the Raman and photoluminescence spectra of porous silicon layers (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier ; Rubim, Joel Camargo
Source: Journal of Raman Spectroscopy. Unidades: EP, IQ
Assunto: DISPOSITIVOS ELETRÔNICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier e RUBIM, Joel Camargo. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. Journal of Raman Spectroscopy, v. 30, p. 29-36, 1999Tradução . . Disponível em: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p. Acesso em: 06 jun. 2024.
APA
Salcedo, W. J., Ramírez Fernandez, F. J., & Rubim, J. C. (1999). Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. Journal of Raman Spectroscopy, 30, 29-36. doi:10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p
NLM
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers [Internet]. Journal of Raman Spectroscopy. 1999 ; 30 29-36.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p
Vancouver
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers [Internet]. Journal of Raman Spectroscopy. 1999 ; 30 29-36.[citado 2024 jun. 06 ] Available from: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p
Artigo de periodico
Influence of layer excitation on Raman and photoluminescence spectra and FTIR study of porous silicon layers (1999)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier ; Rubim, Joel Camargo
Source: Brazilian Journal of Physics. Unidades: EP, IQ
Assunto: DISPOSITIVOS ELETRÔNICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier e RUBIM, Joel Camargo. Influence of layer excitation on Raman and photoluminescence spectra and FTIR study of porous silicon layers. Brazilian Journal of Physics, v. 29, n. 4, 1999Tradução . . Disponível em: https://doi.org/10.1590/s0103-97331999000400028. Acesso em: 06 jun. 2024.
APA
Salcedo, W. J., Ramírez Fernandez, F. J., & Rubim, J. C. (1999). Influence of layer excitation on Raman and photoluminescence spectra and FTIR study of porous silicon layers. Brazilian Journal of Physics, 29( 4). doi:10.1590/s0103-97331999000400028
NLM
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Influence of layer excitation on Raman and photoluminescence spectra and FTIR study of porous silicon layers [Internet]. Brazilian Journal of Physics. 1999 ; 29( 4):[citado 2024 jun. 06 ] Available from: https://doi.org/10.1590/s0103-97331999000400028
Vancouver
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Influence of layer excitation on Raman and photoluminescence spectra and FTIR study of porous silicon layers [Internet]. Brazilian Journal of Physics. 1999 ; 29( 4):[citado 2024 jun. 06 ] Available from: https://doi.org/10.1590/s0103-97331999000400028
Trabalho de evento
Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. (em CD-ROM) (1997)
Salcedo, Walter Jaimes ; Ramírez Fernandez, Francisco Javier ; Rubim, Joel Camargo; Matz, M
Source: Proceedings. Conference titles: Conference of the Brazilian Microelectronics Society. Unidades: EP, IQ
Subjects: CIRCUITOS INTEGRADOS, SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALCEDO, Walter Jaimes et al. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. (em CD-ROM). 1997, Anais.. Itajubá: SBMICRO/EFEI, 1997. . Acesso em: 06 jun. 2024.
APA
Salcedo, W. J., Ramírez Fernandez, F. J., Rubim, J. C., & Matz, M. (1997). Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. (em CD-ROM). In Proceedings. Itajubá: SBMICRO/EFEI.
NLM
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC, Matz M. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. (em CD-ROM). Proceedings. 1997 ;[citado 2024 jun. 06 ]
Vancouver
Salcedo WJ, Ramírez Fernandez FJ, Rubim JC, Matz M. Polarization effect on Raman scattering and photoluminescence spectra in porous silicon layer. (em CD-ROM). Proceedings. 1997 ;[citado 2024 jun. 06 ]

USP Schools

ReP

Filtros

Authors

USP affiliated authors

Date published

Subjects

Source title

Indexado em