Computed X-ray tomography for analyzing polymer insulators (2001)
Nome do evento: Annual Report Conference on Electrical Insulation and Dieletric Phenomena. Unidades: EESC, IQSCAssuntos: TOMOGRAFIA COMPUTADORIZADA DE EMISSÃO, POLÍMEROS (MATERIAIS)
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ALTAFIM, Ruy Alberto Corrêa et al. Computed X-ray tomography for analyzing polymer insulators. 2001, Anais.. Kitchener: IEEE Dielectrics and Insulation Society, 2001. Disponível em: https://repositorio.usp.br/directbitstream/c87ca238-c50b-4f7e-83a2-76097321ea17/PROD_0000173_SYSNO_1211149.pdf. Acesso em: 07 maio 2024.APA
Altafim, R. A. C., Murakami, C. R., Naime, J. M., Chierice, G. O., & Mascarenhas, S. (2001). Computed X-ray tomography for analyzing polymer insulators. In . Kitchener: IEEE Dielectrics and Insulation Society. Recuperado de https://repositorio.usp.br/directbitstream/c87ca238-c50b-4f7e-83a2-76097321ea17/PROD_0000173_SYSNO_1211149.pdfNLM
Altafim RAC, Murakami CR, Naime JM, Chierice GO, Mascarenhas S. Computed X-ray tomography for analyzing polymer insulators [Internet]. 2001 ;[citado 2024 maio 07 ] Available from: https://repositorio.usp.br/directbitstream/c87ca238-c50b-4f7e-83a2-76097321ea17/PROD_0000173_SYSNO_1211149.pdfVancouver
Altafim RAC, Murakami CR, Naime JM, Chierice GO, Mascarenhas S. Computed X-ray tomography for analyzing polymer insulators [Internet]. 2001 ;[citado 2024 maio 07 ] Available from: https://repositorio.usp.br/directbitstream/c87ca238-c50b-4f7e-83a2-76097321ea17/PROD_0000173_SYSNO_1211149.pdf
