X-ray production yield in standardized thick target PIXE (2006)
Source: Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, ANÁLISE DE DADOS, ESPECTROMETRIA
ABNT
ABURAYA, Jim Heiji et al. X-ray production yield in standardized thick target PIXE. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms, v. 249, n. 1-2, p. 792-795, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2006.03.141. Acesso em: 19 set. 2024.APA
Aburaya, J. H., Added, N., Tabacniks, M. H., Rizzutto, M. de A., & Barbosa, M. D. L. (2006). X-ray production yield in standardized thick target PIXE. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms, 249( 1-2), 792-795. doi:10.1016/j.nimb.2006.03.141NLM
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A, Barbosa MDL. X-ray production yield in standardized thick target PIXE [Internet]. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms. 2006 ; 249( 1-2): 792-795.[citado 2024 set. 19 ] Available from: https://doi.org/10.1016/j.nimb.2006.03.141Vancouver
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A, Barbosa MDL. X-ray production yield in standardized thick target PIXE [Internet]. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms. 2006 ; 249( 1-2): 792-795.[citado 2024 set. 19 ] Available from: https://doi.org/10.1016/j.nimb.2006.03.141