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Artigo de periodico
Probing device degradation and electric fields in polymeric field-effect transistors by SFG vibrational spectroscopy (2018)
Motti, Silvia G.; Cardoso, Lilian S.; Gomes, Douglas J. C.; Faria, Roberto Mendonça ; Miranda, Paulo Barbeitas
Source: Journal of Physical Chemistry C. Unidade: IFSC
Subjects: FILMES FINOS, TRANSISTORES, DIELÉTRICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MOTTI, Silvia G. et al. Probing device degradation and electric fields in polymeric field-effect transistors by SFG vibrational spectroscopy. Journal of Physical Chemistry C, v. 122, n. 19, p. 10450-10458, 2018Tradução . . Disponível em: https://doi.org/10.1021/acs.jpcc.8b01760. Acesso em: 02 nov. 2024.
APA
Motti, S. G., Cardoso, L. S., Gomes, D. J. C., Faria, R. M., & Miranda, P. B. (2018). Probing device degradation and electric fields in polymeric field-effect transistors by SFG vibrational spectroscopy. Journal of Physical Chemistry C, 122( 19), 10450-10458. doi:10.1021/acs.jpcc.8b01760
NLM
Motti SG, Cardoso LS, Gomes DJC, Faria RM, Miranda PB. Probing device degradation and electric fields in polymeric field-effect transistors by SFG vibrational spectroscopy [Internet]. Journal of Physical Chemistry C. 2018 ; 122( 19): 10450-10458.[citado 2024 nov. 02 ] Available from: https://doi.org/10.1021/acs.jpcc.8b01760
Vancouver
Motti SG, Cardoso LS, Gomes DJC, Faria RM, Miranda PB. Probing device degradation and electric fields in polymeric field-effect transistors by SFG vibrational spectroscopy [Internet]. Journal of Physical Chemistry C. 2018 ; 122( 19): 10450-10458.[citado 2024 nov. 02 ] Available from: https://doi.org/10.1021/acs.jpcc.8b01760
Trabalho de evento
Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors (2016)
Gomes, Douglas J. C.; Motti, Silvia G.; Miranda, Paulo Barbeitas
Source: Proceedings. Conference titles: International Conference on Photonics, Optics and Laser Technology - PHOTOPTICS. Unidade: IFSC
Subjects: TRANSISTORES, CAMPO ELETROMAGNÉTICO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GOMES, Douglas J. C. e MOTTI, Silvia G. e MIRANDA, Paulo Barbeitas. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors. 2016, Anais.. Setúbal: Science and Technology Publications - SCITEPRESS, 2016. Disponível em: https://doi.org/10.5220/0005812801920196. Acesso em: 02 nov. 2024.
APA
Gomes, D. J. C., Motti, S. G., & Miranda, P. B. (2016). Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors. In Proceedings. Setúbal: Science and Technology Publications - SCITEPRESS. doi:10.5220/0005812801920196
NLM
Gomes DJC, Motti SG, Miranda PB. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors [Internet]. Proceedings. 2016 ;[citado 2024 nov. 02 ] Available from: https://doi.org/10.5220/0005812801920196
Vancouver
Gomes DJC, Motti SG, Miranda PB. Using sum-frequency generation (SFG) to probe electric-fields within organic field-effect transistors [Internet]. Proceedings. 2016 ;[citado 2024 nov. 02 ] Available from: https://doi.org/10.5220/0005812801920196
Trabalho de evento-resumo periodico
Probing electric fields within organic transistors by nonlinear optics (2015)
Miranda, Paulo Barbeitas ; Motti, Silvia G.; Gomes, Douglas J. C.
Source: Bulletin of the American Physical Society. Conference titles: APS March Meeting. Unidade: IFSC
Subjects: ÓPTICA NÃO LINEAR, TRANSISTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MIRANDA, Paulo Barbeitas e MOTTI, Silvia G. e GOMES, Douglas J. C. Probing electric fields within organic transistors by nonlinear optics. Bulletin of the American Physical Society. College Park: American Physical Society - APS. Disponível em: http://meetings.aps.org/link/BAPS.2015.MAR.L41.8. Acesso em: 02 nov. 2024. , 2015
APA
Miranda, P. B., Motti, S. G., & Gomes, D. J. C. (2015). Probing electric fields within organic transistors by nonlinear optics. Bulletin of the American Physical Society. College Park: American Physical Society - APS. Recuperado de http://meetings.aps.org/link/BAPS.2015.MAR.L41.8
NLM
Miranda PB, Motti SG, Gomes DJC. Probing electric fields within organic transistors by nonlinear optics [Internet]. Bulletin of the American Physical Society. 2015 ; 60( 1):[citado 2024 nov. 02 ] Available from: http://meetings.aps.org/link/BAPS.2015.MAR.L41.8
Vancouver
Miranda PB, Motti SG, Gomes DJC. Probing electric fields within organic transistors by nonlinear optics [Internet]. Bulletin of the American Physical Society. 2015 ; 60( 1):[citado 2024 nov. 02 ] Available from: http://meetings.aps.org/link/BAPS.2015.MAR.L41.8

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