Filtros : "Universités Aix-Marseille, Institut Matériaux Microélectronique Nanosciences de Provence, IM2NP, Saint Jérôme, Marseille, France" "Zílio, Sérgio Carlos" Removidos: "ARTIGO DE JORNAL-RESENHA" "COZZOLINO, SILVIA MARIA FRANCISCATO" "ai" Limpar

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  • Source: Optical Engineering. Unidade: IFSC

    Subjects: ÓPTICA, FILMES FINOS, BLENDAS

    Acesso à fonteDOIHow to cite
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    • ABNT

      WOOD, Thomas et al. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, v. 52, n. 9, p. 094104-1-094104-10, 2013Tradução . . Disponível em: https://doi.org/10.1117/1.OE.52.9.094104. Acesso em: 01 jun. 2024.
    • APA

      Wood, T., Le Rouzo, J., Flory, F., Coudray, P., Mastelaro, V. R., Pelissari, P., & Zílio, S. C. (2013). Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors. Optical Engineering, 52( 9), 094104-1-094104-10. doi:10.1117/1.OE.52.9.094104
    • NLM

      Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2024 jun. 01 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104
    • Vancouver

      Wood T, Le Rouzo J, Flory F, Coudray P, Mastelaro VR, Pelissari P, Zílio SC. Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors [Internet]. Optical Engineering. 2013 ; 52( 9): 094104-1-094104-10.[citado 2024 jun. 01 ] Available from: https://doi.org/10.1117/1.OE.52.9.094104
  • Source: Program Book. Conference titles: Brazilian MRS Meeting. Unidade: IFSC

    Subjects: LASER, FILMES FINOS, SENSOR, OZÔNIO

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      SILVA, Luís F. et al. Nanocrystalline SrTi1-xFexO3 films: ozone and nitrogen dioxide sensing properties. 2013, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2013. . Acesso em: 01 jun. 2024.
    • APA

      Silva, L. F., Mastelaro, V. R., Zílio, S. C., Bernardi, M. I. B., Ribeiro, C., Longo, E., & Aguir, K. (2013). Nanocrystalline SrTi1-xFexO3 films: ozone and nitrogen dioxide sensing properties. In Program Book. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat.
    • NLM

      Silva LF, Mastelaro VR, Zílio SC, Bernardi MIB, Ribeiro C, Longo E, Aguir K. Nanocrystalline SrTi1-xFexO3 films: ozone and nitrogen dioxide sensing properties. Program Book. 2013 ;[citado 2024 jun. 01 ]
    • Vancouver

      Silva LF, Mastelaro VR, Zílio SC, Bernardi MIB, Ribeiro C, Longo E, Aguir K. Nanocrystalline SrTi1-xFexO3 films: ozone and nitrogen dioxide sensing properties. Program Book. 2013 ;[citado 2024 jun. 01 ]

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