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Filtros : "FILMES FINOS" "Facultés Universitaires Notre Dame de la Paix, Laboratoire Interdisciplinaire de Spectroscopie Electronique, Namur, Belgium" "IFSC" Removido: "NANOPARTÍCULAS" Limpar

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  • Artigo de periodico

    Characterization of W'O IND. 3': Ag films: ToF-SIMS studies of ammonia adsorption (2005)

    Bittencourt, Carla; Felicissimo, M. P.; Felten, A.; Nunes, Luiz Antônio de Oliveira; Ivanov, P.; Llobet, E.; Pireaux, Jean-Jacques; Houssiau, Laurent

    Source: Applied Surface Science. Unidade: IFSC

    Subjects: FILMES FINOS, SEMICONDUTORES, AMÔNIA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      BITTENCOURT, Carla et al. Characterization of W'O IND. 3': Ag films: ToF-SIMS studies of ammonia adsorption. Applied Surface Science, v. 250, n. 1/4, p. 21-28, 2005Tradução . . Acesso em: 29 maio 2024.

    • APA

      Bittencourt, C., Felicissimo, M. P., Felten, A., Nunes, L. A. de O., Ivanov, P., Llobet, E., et al. (2005). Characterization of W'O IND. 3': Ag films: ToF-SIMS studies of ammonia adsorption. Applied Surface Science, 250( 1/4), 21-28.

    • NLM

      Bittencourt C, Felicissimo MP, Felten A, Nunes LA de O, Ivanov P, Llobet E, Pireaux J-J, Houssiau L. Characterization of W'O IND. 3': Ag films: ToF-SIMS studies of ammonia adsorption. Applied Surface Science. 2005 ; 250( 1/4): 21-28.[citado 2024 maio 29 ]

    • Vancouver

      Bittencourt C, Felicissimo MP, Felten A, Nunes LA de O, Ivanov P, Llobet E, Pireaux J-J, Houssiau L. Characterization of W'O IND. 3': Ag films: ToF-SIMS studies of ammonia adsorption. Applied Surface Science. 2005 ; 250( 1/4): 21-28.[citado 2024 maio 29 ]

  • Artigo de periodico

    Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy (2004)

    Bittencourt, C.; Llobet, E.; Ivanov, P; Vilanova, X.; Correig, X.; Silva, Marcelo de Assumpção Pereira da ; Nunes, Luiz Antônio de Oliveira; Pireaux, J. J.

    Source: Journal of Physics D. Unidade: IFSC

    Subjects: FILMES FINOS, SENSORES ÓTICOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      BITTENCOURT, C. et al. Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy. Journal of Physics D, v. 37, n. 24, p. 3383-3391, 2004Tradução . . Disponível em: https://doi.org/10.1088/0022-3727/37/24/005. Acesso em: 29 maio 2024.

    • APA

      Bittencourt, C., Llobet, E., Ivanov, P., Vilanova, X., Correig, X., Silva, M. de A. P. da, et al. (2004). Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy. Journal of Physics D, 37( 24), 3383-3391. doi:10.1088/0022-3727/37/24/005

    • NLM

      Bittencourt C, Llobet E, Ivanov P, Vilanova X, Correig X, Silva M de AP da, Nunes LA de O, Pireaux JJ. Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy [Internet]. Journal of Physics D. 2004 ; 37( 24): 3383-3391.[citado 2024 maio 29 ] Available from: https://doi.org/10.1088/0022-3727/37/24/005

    • Vancouver

      Bittencourt C, Llobet E, Ivanov P, Vilanova X, Correig X, Silva M de AP da, Nunes LA de O, Pireaux JJ. Ag induced modifications on W 'O IND.3' films studied by AFM, Raman and x-ray photoelectron spectroscopy [Internet]. Journal of Physics D. 2004 ; 37( 24): 3383-3391.[citado 2024 maio 29 ] Available from: https://doi.org/10.1088/0022-3727/37/24/005
  • 1

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