Filtros : "Indexado no INSPEC" "1999" "Journal of Raman Spectroscopy" "EP" Removido: "Tribess, Arlindo" Limpar

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  • Fonte: Journal of Raman Spectroscopy. Unidades: EP, IQ

    Assunto: DISPOSITIVOS ELETRÔNICOS

    Acesso à fonteDOIComo citar
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    • ABNT

      SALCEDO, Walter Jaimes e RAMÍREZ FERNANDEZ, Francisco Javier e RUBIM, Joel Camargo. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. Journal of Raman Spectroscopy, v. 30, p. 29-36, 1999Tradução . . Disponível em: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p. Acesso em: 11 jun. 2024.
    • APA

      Salcedo, W. J., Ramírez Fernandez, F. J., & Rubim, J. C. (1999). Polarization effects on the Raman and photoluminescence spectra of porous silicon layers. Journal of Raman Spectroscopy, 30, 29-36. doi:10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p
    • NLM

      Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers [Internet]. Journal of Raman Spectroscopy. 1999 ; 30 29-36.[citado 2024 jun. 11 ] Available from: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p
    • Vancouver

      Salcedo WJ, Ramírez Fernandez FJ, Rubim JC. Polarization effects on the Raman and photoluminescence spectra of porous silicon layers [Internet]. Journal of Raman Spectroscopy. 1999 ; 30 29-36.[citado 2024 jun. 11 ] Available from: https://doi.org/10.1002/(sici)1097-4555(199901)30:1%3C29::aid-jrs337%3E3.0.co;2-p

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