Film thickness measurement system using FPGA technology (2015)
Source: Proceedings. Conference titles: Symposium on Signal Processing, Images and Computer Vision - STSIVA. Unidade: EESC
Subjects: FILMES FINOS, FLUXO DOS LÍQUIDOS, ESCOAMENTO, ENGENHARIA MECÂNICA
ABNT
BONILLA RIAÑO, Adriana et al. Film thickness measurement system using FPGA technology. 2015, Anais.. Piscataway, NJ, USA: IEEE, 2015. Disponível em: https://doi.org/10.1109/STSIVA.2015.7330426. Acesso em: 04 jun. 2024.APA
Bonilla Riaño, A., Bannwart, A. C., Velasco Peña, H. F., & Hernandez Rodriguez, O. M. (2015). Film thickness measurement system using FPGA technology. In Proceedings. Piscataway, NJ, USA: IEEE. doi:10.1109/STSIVA.2015.7330426NLM
Bonilla Riaño A, Bannwart AC, Velasco Peña HF, Hernandez Rodriguez OM. Film thickness measurement system using FPGA technology [Internet]. Proceedings. 2015 ;[citado 2024 jun. 04 ] Available from: https://doi.org/10.1109/STSIVA.2015.7330426Vancouver
Bonilla Riaño A, Bannwart AC, Velasco Peña HF, Hernandez Rodriguez OM. Film thickness measurement system using FPGA technology [Internet]. Proceedings. 2015 ;[citado 2024 jun. 04 ] Available from: https://doi.org/10.1109/STSIVA.2015.7330426